Lee Se Jun

Kim Young Joon

Ku Dong Hun

Kim Min Gyu

Lee Jung Hoon

Lee Shin Yong

Cho Young Chan

Choi Garam

Lee Seung Woo

Kim Jin Yong

Kim Do Hun

Kim Nam Yoon

Kim Sang Yun

Kim Jae Ho

Kim Min Gab

Kim Min Soo

Kwon Soon Yang

Lee Myung Sun

Mun Jung Il

Ahn Jae Hyung

Kim Kwang Rak

Hyun Chang Hong

Yoon Do Hyung

Kim Sung Ryong

Park Sung Hun

Jo Tae Young

Doan Nam Thai

Kim Tae Wook

Li Chu Zheng

Kim Yoo Sik

Lee Jung Ho

Yoon Sung Won

Kim Jung Hwan

Kim Seok

Hwang Young Min

Lee Il Hwan

Ahn Woo Jung

Shin Hyun Jang

Lee Dong Sung

Park Jong Ho

Moon Jun Hee

Lee Suk Won

Ahn Ji Yoon

Lee Jong Hwan

Kim Jong Young

Bak Seung Kwan

Lee Eui Geon

Kim Won Jin

Park Ji Hun

Park Ji Tae

Kim Seung Jae

Kim Sung Wook

Lee Yong Jun

Lee Yoon Hyuk

Lee Jong Hoon

No Ha Na

Yoon Dae Gun

Lee Sun Mi

Zhang Ze Woo

Lee Ki Hun

Choi Soon Min

Kim Chang Gon

Lee Ki Bae

Chu Ji Min

Lee Sang Chul

Kim Gang Gun

Im Do Gyeong

Ha Sang Mo

Oh Kyung Kyun

Park Sung Hoon

Yang Sung Wook

Kang Seong Beom

An Jun

Yoo Jae Suk

Seong Ho Yong

Ahn Sung Min

Song Zhengyu

Kim Hyun Jun

Kim Yu Sik

Park Ji Yeol

Lee Dong Jun

Lee Jong Hwa

Cho Hoon Koo

Kang Hyun Jae

Seo Dae Gyu

Um Yong Hwan

Lee Gi Su

Roh Young Hun

Lee Chang Ha

Han Sang Jin

Kim Ki Heung

Sin Ho Seung

Li Zhu Cheng

Cho Sang Hyun

Kim Young Sam

Park Jae Sung

Kim In Ki

Yeo In Jae

Kim Young Ho

Hwang Sang Wook

서울대학교 박희재 명예교수 홈페이지에
방문해 주신 여러분을 환영합니다.
대학에서의 연구개발은 창업과 산학협력을 통해 기술보국으로서 국가
와 사회에 기여해야 합니다.
그리고 이는 오로지 열정과 도전을 통해서만 성취할 수 있습니다.
개방적 혁신과 주인의식을 바탕으로 기업가 정신을 발휘하여 시장에서
인정하는 최고의 기술을 개발하기를 기원합니다.

정밀측정 및 메카트로닉스 연구실에 대한 설명이 없습니다.

Snapshot angle-resolved channeled spectroscopic micro-ellipsometry for thin-film characterization

Enhancing Battery Exterior Defect Inspection Accuracy Through Defect-Background Separated GAN Development

Angle-resolving spectral ellipsometry using structured light for direct measurement of ellipsometric parameters

Development of Virtual Coordinate Measuring Machines Incorporating Probe Errors

Development of Computer Aided Calibration Module for CMMs and Machine Tools using a Compensated Step Gauge

Development of Computer Integrated System for Error Diagnosis of a CMM using Calibrated Mechanical Artefacts

Application of Microcomputer for Assessing the Probe Lobing Error and Geometric Errors of CMMs using Commercial Ring Gauges

Development of Straightness Measurement Technique using Profile Matching Method

Integrated Real Time Compensation System for Errors Introduced by Measurement Probe and Machine Geometry in Commercial CMMs

A New Technique for Volumetric Error Assessment of CNC Machine Tools Incorporating the Ball Bar Measurement and the 3D Volumetric Error Model

New Error Correction Algorithms Minimizing Residual Positional Error for a Computer Integrated Calibration/Correction System in Computer Numerically Controlled Machine Tools

Thermal Error Measurement and Modeling Techniques for the Five-Degree-of-Freedom Spindle Drifts in Computer Numerically Controlled Machine Tools

Thermal Error Measurement and Real Time Compensation System for the CNC Machine Tools Incorporating the Spindle Thermal Error and the Feed Axis Thermal Error

Development of Computer Aided Inspection System with CMM for Integrated Mold manufacturing

Integrated Precision Inspection System for Manufacturing of Moulds having CAD Defined Features

Precision Alignment Technique for Parts having Thin Features using Measurement Feedback Iterative Method in CAD/CAI Environment

Precision Inspection System for Aircraft Parts having very Thin Features Based on CAD/CAI Integration

Integrated Precision Inspection System for Manufacturing Based on CAD/CAM/CAI Environment

5-FREE GEOMETRIC ERROR MEASUREMENT OF MACHINE GUIDE WAYS

PARALLEL ERROR MEASUREMENT OF BEAM SEPARATOR

DEVICE AND METHOD FOR COMPENSATING BACK-LASH OF NUMERICAL CONTROLLER

AUTOMATIC INSPECTION SYSTEM FOR CAMERA LENSES AND METHOD THEREOF USING A LINE CHARGE COUPLED DEVICE

METHOD FOR MEASURING NON-CONTACT TYPE THREE-DIMENSIONAL MINUTE SHAPE USING OPTICAL WINDOW

METHOD FOR MEASURING 3-DIMENSIONAL VOLUMETRIC ERROR IN MULTI-AXIS MACHINE TOOLS

HEAT CHANGE ERROR MEASURING SYSTEM

APPARATUS FOR MEASURING THREE DIMENSIONAL VOLUMETRIC ERROR IN MULTI-AXIS MACHINE TOOLS

ULTRA-PRECISION POSITIONING SYSTEM

ULTRA-PRECISION FEEDING APPARATUS

박희재

Professor Emeritus

Precision Metrology Lab

교수님 소개

박희재

연구실 소개

연구실 키워드

알럼나이가 간 회사

연구실 지원 방법

대우 조건

연도별 논문 인용수

저널 & 학회 논문 출판 수

연구실 논문 목록

Snapshot angle-resolved channeled spectroscopic micro-ellipsometry for thin-film characterization

Enhancing Battery Exterior Defect Inspection Accuracy Through Defect-Background Separated GAN Development

Angle-resolving spectral ellipsometry using structured light for direct measurement of ellipsometric parameters

연구실 보유 특허

대학별 입시끈

우리 연구실 모집

교수님 소개

박희재

연구실 키워드

알럼나이가 간 회사

연구실 지원 방법

대우 조건

연도별 논문 인용수

저널 & 학회 논문 출판 수

연구실 논문 목록

Snapshot angle-resolved channeled spectroscopic micro-ellipsometry for thin-film characterization

Enhancing Battery Exterior Defect Inspection Accuracy Through Defect-Background Separated GAN Development

Angle-resolving spectral ellipsometry using structured light for direct measurement of ellipsometric parameters

연구실 보유 특허

최근 3년간 연구실적 높은 연구실

대학별 입시끈

우리 연구실 모집